Atomic Force Microscope (AFM)
Horiba SmartSPM AIST
The SmartSPM Scanning Probe Microscope is a fully automated system that offers ultra-fast
and high-resolution measurements for the most advanced materials research at the nano
scale in all AFM modes
Key Features:
- High speed 100µm scanner
- 1300nm AFM laser
- Lowest noise closed loop sensors
Operating Modes:
- Contact and Non-contact AFM mode in air/liquid
- Conductive AFM
- Kelvin Probe (Surface Potential Microscopy)
- Nanolithography